【工作笔记】给状元的样品加工
02 March 2017
This is the sample log
- test: NV are on the depth of about 20um, no shallow NV
- ICP long time (recipe: Ar/Cl2 160W 200W 30min * 12times real depth = 10.11um) follows piranha clean
- test: surface is a slope - unable to determine surface position; surface is dirty
- ICP (recipe: O2-7/Ar-8 normal) follows piranha clean
- test: surface is still bad (slope even broader), no NV in proper depth
- ICP (recipe: O2-7/Ar-8 normal) follows piranha clean
- test: the same as ICP before
- ICP (recipe: Ar/Cl2 200W 320W 1. 1h real_depth=2.5um 2. 2h real_depth=5.65um total_depth=8.58um) follows piranha clean
- Piranha, Evaporate Al 20nm
- adhere sample to stage by colloidal silver and bake 30min at 110°C
- FIB chipname and markers (700um*700um)
- remove Al and colloidal silver
- NV location (found 10)
- NV spectrum testing (Chang Xiuying)
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